SMART errors on root filesystem

O

onixid

Member
May 16, 2020
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Hi,
I noticed that one of my containers was down, and, when I tried to start it, it returned some I/O errors.
So I checked the disk with smartctl and this is what I got:

Code: 
root@pve:/var/lib/lxc# smartctl -a /dev/sde
smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.15.74-1-pve] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Device Model:     Samsung SSD 870 EVO 500GB
Serial Number:    S62BNF0R902637L
LU WWN Device Id: 5 002538 f41900b92
Firmware Version: SVT01B6Q
User Capacity:    500,107,862,016 bytes [500 GB]
Sector Size:      512 bytes logical/physical
Rotation Rate:    Solid State Device
Form Factor:      2.5 inches
TRIM Command:     Available, deterministic, zeroed
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   ACS-4 T13/BSR INCITS 529 revision 5
SATA Version is:  SATA 3.3, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is:    Tue Dec 27 11:53:58 2022 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00) Offline data collection activity
                                        was never started.
                                        Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0) The previous self-test routine completed
                                        without error or no self-test has ever
                                        been run.
Total time to complete Offline
data collection:                (    0) seconds.
Offline data collection
capabilities:                    (0x53) SMART execute Offline immediate.
                                        Auto Offline data collection on/off support.
                                        Suspend Offline collection upon new
                                        command.
                                        No Offline surface scan supported.
                                        Self-test supported.
                                        No Conveyance Self-test supported.
                                        Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                                        power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                                        General Purpose Logging supported.
Short self-test routine
recommended polling time:        (   2) minutes.
Extended self-test routine
recommended polling time:        (  85) minutes.
SCT capabilities:              (0x003d) SCT Status supported.
                                        SCT Error Recovery Control supported.
                                        SCT Feature Control supported.
                                        SCT Data Table supported.

SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  5 Reallocated_Sector_Ct   0x0033   082   082   010    Pre-fail  Always       -       107
  9 Power_On_Hours          0x0032   098   098   000    Old_age   Always       -       8687
 12 Power_Cycle_Count       0x0032   099   099   000    Old_age   Always       -       27
177 Wear_Leveling_Count     0x0013   099   099   000    Pre-fail  Always       -       15
179 Used_Rsvd_Blk_Cnt_Tot   0x0013   082   082   010    Pre-fail  Always       -       107
181 Program_Fail_Cnt_Total  0x0032   100   100   010    Old_age   Always       -       0
182 Erase_Fail_Count_Total  0x0032   100   100   010    Old_age   Always       -       0
183 Runtime_Bad_Block       0x0013   082   082   010    Pre-fail  Always       -       107
187 Reported_Uncorrect      0x0032   099   099   000    Old_age   Always       -       68
190 Airflow_Temperature_Cel 0x0032   068   052   000    Old_age   Always       -       32
195 Hardware_ECC_Recovered  0x001a   199   199   000    Old_age   Always       -       68
199 UDMA_CRC_Error_Count    0x003e   100   100   000    Old_age   Always       -       0
235 Unknown_Attribute       0x0012   099   099   000    Old_age   Always       -       11
241 Total_LBAs_Written      0x0032   099   099   000    Old_age   Always       -       13728956990

SMART Error Log Version: 1
ATA Error Count: 68 (device log contains only the most recent five errors)
        CR = Command Register [HEX]
        FR = Features Register [HEX]
        SC = Sector Count Register [HEX]
        SN = Sector Number Register [HEX]
        CL = Cylinder Low Register [HEX]
        CH = Cylinder High Register [HEX]
        DH = Device/Head Register [HEX]
        DC = Device Command Register [HEX]
        ER = Error register [HEX]
        ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 68 occurred at disk power-on lifetime: 8687 hours (361 days + 23 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 a8 d8 6f 92 40  Error: UNC at LBA = 0x00926fd8 = 9596888

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 38 a8 d8 6f 92 40 15   6d+19:15:47.166  READ FPDMA QUEUED
  60 10 a0 b0 6f 92 40 14   6d+19:15:47.166  READ FPDMA QUEUED
  60 08 70 18 26 e2 40 0e   6d+19:15:47.166  READ FPDMA QUEUED
  2f 00 01 30 06 00 40 1f   6d+19:15:47.166  READ LOG EXT
  2f 00 01 30 00 00 40 1f   6d+19:15:47.166  READ LOG EXT

Error 67 occurred at disk power-on lifetime: 8687 hours (361 days + 23 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 f8 18 26 e2 40  Error: UNC at LBA = 0x00e22618 = 14820888

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 08 f8 18 26 e2 40 1f   6d+19:15:46.948  READ FPDMA QUEUED
  2f 00 01 30 06 00 40 15   6d+19:15:46.948  READ LOG EXT
  2f 00 01 30 00 00 40 15   6d+19:15:46.948  READ LOG EXT
  2f 00 01 00 00 00 40 15   6d+19:15:46.948  READ LOG EXT
  2f 00 01 30 08 00 40 15   6d+19:15:46.948  READ LOG EXT

Error 66 occurred at disk power-on lifetime: 8687 hours (361 days + 23 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 a8 18 26 e2 40  Error: UNC at LBA = 0x00e22618 = 14820888

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 08 a8 18 26 e2 40 15   6d+19:15:46.765  READ FPDMA QUEUED
  60 08 78 f0 27 e2 40 0f   6d+19:15:46.765  READ FPDMA QUEUED
  60 18 a0 10 01 94 40 14   6d+19:15:46.765  READ FPDMA QUEUED
  60 08 98 00 01 94 40 13   6d+19:15:46.765  READ FPDMA QUEUED
  60 08 70 e8 27 e2 40 0e   6d+19:15:46.765  READ FPDMA QUEUED

Error 65 occurred at disk power-on lifetime: 8687 hours (361 days + 23 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 20 18 26 e2 40  Error: UNC at LBA = 0x00e22618 = 14820888

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 08 20 18 26 e2 40 04   6d+19:15:46.515  READ FPDMA QUEUED
  60 08 18 d0 ec 93 40 03   6d+19:15:46.515  READ FPDMA QUEUED
  60 28 10 98 ec 93 40 02   6d+19:15:46.515  READ FPDMA QUEUED
  60 08 08 88 ec 93 40 01   6d+19:15:46.515  READ FPDMA QUEUED
  60 08 00 78 ec 93 40 00   6d+19:15:46.515  READ FPDMA QUEUED

Error 64 occurred at disk power-on lifetime: 8687 hours (361 days + 23 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 a0 18 26 e2 40  Error: UNC at LBA = 0x00e22618 = 14820888

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 08 a0 18 26 e2 40 14   6d+19:15:46.333  READ FPDMA QUEUED
  60 08 98 10 26 e2 40 13   6d+19:15:46.333  READ FPDMA QUEUED
  60 08 90 08 26 e2 40 12   6d+19:15:46.333  READ FPDMA QUEUED
  60 08 88 00 26 e2 40 11   6d+19:15:46.333  READ FPDMA QUEUED
  60 08 80 f8 25 e2 40 10   6d+19:15:46.333  READ FPDMA QUEUED

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
  256        0    65535  Read_scanning was never started
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

root@pve:/var/lib/lxc#

The disk is only 1 year old, how can I attempt to fix this situation?
 
Does it work now without any issues?

Perhaps Samsung provides a tool to check the disk health, which may be able to provide some more information?
 
mira said:
Does it work now without any issues?

Perhaps Samsung provides a tool to check the disk health, which may be able to provide some more information?
Click to expand...
Well, I ran a "surface" scan of the original disk and it reported some read errors, which caused some information loss that impacted one of my containers that didn't start anymore.
Luckily I partially got it back as I had an almost year-old backup of it, it's not the entire thing, but it is better than losing it completely.
 
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