Hi,
I noticed that one of my containers was down, and, when I tried to start it, it returned some I/O errors.
So I checked the disk with smartctl and this is what I got:
The disk is only 1 year old, how can I attempt to fix this situation?
I noticed that one of my containers was down, and, when I tried to start it, it returned some I/O errors.
So I checked the disk with smartctl and this is what I got:
Code:
root@pve:/var/lib/lxc# smartctl -a /dev/sde
smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.15.74-1-pve] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: Samsung SSD 870 EVO 500GB
Serial Number: S62BNF0R902637L
LU WWN Device Id: 5 002538 f41900b92
Firmware Version: SVT01B6Q
User Capacity: 500,107,862,016 bytes [500 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5
SATA Version is: SATA 3.3, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Tue Dec 27 11:53:58 2022 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0033 082 082 010 Pre-fail Always - 107
9 Power_On_Hours 0x0032 098 098 000 Old_age Always - 8687
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 27
177 Wear_Leveling_Count 0x0013 099 099 000 Pre-fail Always - 15
179 Used_Rsvd_Blk_Cnt_Tot 0x0013 082 082 010 Pre-fail Always - 107
181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0
182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
183 Runtime_Bad_Block 0x0013 082 082 010 Pre-fail Always - 107
187 Reported_Uncorrect 0x0032 099 099 000 Old_age Always - 68
190 Airflow_Temperature_Cel 0x0032 068 052 000 Old_age Always - 32
195 Hardware_ECC_Recovered 0x001a 199 199 000 Old_age Always - 68
199 UDMA_CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0
235 Unknown_Attribute 0x0012 099 099 000 Old_age Always - 11
241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 13728956990
SMART Error Log Version: 1
ATA Error Count: 68 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 68 occurred at disk power-on lifetime: 8687 hours (361 days + 23 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 a8 d8 6f 92 40 Error: UNC at LBA = 0x00926fd8 = 9596888
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 38 a8 d8 6f 92 40 15 6d+19:15:47.166 READ FPDMA QUEUED
60 10 a0 b0 6f 92 40 14 6d+19:15:47.166 READ FPDMA QUEUED
60 08 70 18 26 e2 40 0e 6d+19:15:47.166 READ FPDMA QUEUED
2f 00 01 30 06 00 40 1f 6d+19:15:47.166 READ LOG EXT
2f 00 01 30 00 00 40 1f 6d+19:15:47.166 READ LOG EXT
Error 67 occurred at disk power-on lifetime: 8687 hours (361 days + 23 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 f8 18 26 e2 40 Error: UNC at LBA = 0x00e22618 = 14820888
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 08 f8 18 26 e2 40 1f 6d+19:15:46.948 READ FPDMA QUEUED
2f 00 01 30 06 00 40 15 6d+19:15:46.948 READ LOG EXT
2f 00 01 30 00 00 40 15 6d+19:15:46.948 READ LOG EXT
2f 00 01 00 00 00 40 15 6d+19:15:46.948 READ LOG EXT
2f 00 01 30 08 00 40 15 6d+19:15:46.948 READ LOG EXT
Error 66 occurred at disk power-on lifetime: 8687 hours (361 days + 23 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 a8 18 26 e2 40 Error: UNC at LBA = 0x00e22618 = 14820888
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 08 a8 18 26 e2 40 15 6d+19:15:46.765 READ FPDMA QUEUED
60 08 78 f0 27 e2 40 0f 6d+19:15:46.765 READ FPDMA QUEUED
60 18 a0 10 01 94 40 14 6d+19:15:46.765 READ FPDMA QUEUED
60 08 98 00 01 94 40 13 6d+19:15:46.765 READ FPDMA QUEUED
60 08 70 e8 27 e2 40 0e 6d+19:15:46.765 READ FPDMA QUEUED
Error 65 occurred at disk power-on lifetime: 8687 hours (361 days + 23 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 20 18 26 e2 40 Error: UNC at LBA = 0x00e22618 = 14820888
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 08 20 18 26 e2 40 04 6d+19:15:46.515 READ FPDMA QUEUED
60 08 18 d0 ec 93 40 03 6d+19:15:46.515 READ FPDMA QUEUED
60 28 10 98 ec 93 40 02 6d+19:15:46.515 READ FPDMA QUEUED
60 08 08 88 ec 93 40 01 6d+19:15:46.515 READ FPDMA QUEUED
60 08 00 78 ec 93 40 00 6d+19:15:46.515 READ FPDMA QUEUED
Error 64 occurred at disk power-on lifetime: 8687 hours (361 days + 23 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 a0 18 26 e2 40 Error: UNC at LBA = 0x00e22618 = 14820888
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 08 a0 18 26 e2 40 14 6d+19:15:46.333 READ FPDMA QUEUED
60 08 98 10 26 e2 40 13 6d+19:15:46.333 READ FPDMA QUEUED
60 08 90 08 26 e2 40 12 6d+19:15:46.333 READ FPDMA QUEUED
60 08 88 00 26 e2 40 11 6d+19:15:46.333 READ FPDMA QUEUED
60 08 80 f8 25 e2 40 10 6d+19:15:46.333 READ FPDMA QUEUED
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
256 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
root@pve:/var/lib/lxc#The disk is only 1 year old, how can I attempt to fix this situation?
