# smartctl -t short /dev/sdc
# smartctl -a /dev/sdc
smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.11.22-2-pve] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Apple SD/SM/TS...E/F/G SSDs
Device Model: APPLE SSD SM1024G
Serial Number: redacted
LU WWN Device Id: 5 002538 900000000
Firmware Version: BXW1SA0Q
User Capacity: 1,000,555,581,440 bytes [1.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Jul 19 20:30:34 2021 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 10) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x001a 200 200 000 Old_age Always - 0
5 Reallocated_Sector_Ct 0x0033 100 100 000 Pre-fail Always - 0
9 Power_On_Hours 0x0032 093 093 000 Old_age Always - 33972
12 Power_Cycle_Count 0x0032 084 084 000 Old_age Always - 15802
169 Unknown_Apple_Attrib 0x0013 243 243 010 Pre-fail Always - 7018328887040
173 Wear_Leveling_Count 0x0032 171 171 100 Old_age Always - 2796081840867
174 Host_Reads_MiB 0x0022 099 099 000 Old_age Always - 220637518
175 Host_Writes_MiB 0x0022 099 099 000 Old_age Always - 114628728
192 Power-Off_Retract_Count 0x0012 099 099 000 Old_age Always - 78
194 Temperature_Celsius 0x0022 061 021 000 Old_age Always - 39 (Min/Max 2/79)
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
199 UDMA_CRC_Error_Count 0x001a 200 199 000 Old_age Always - 0
SMART Error Log Version: 1
No Errors Logged
Warning! SMART Self-Test Log Structure error: invalid SMART checksum.
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short captive Completed without error 00% 33972 -
# 2 Short offline Completed without error 00% 33972 -
# 3 Short offline Completed without error 00% 33972 -
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.