Device /dev/sda SMART Failure

linedan

Member
Feb 8, 2020
46
1
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Hello!
I have the same log messages over and over again.
For example today, two times since now:
"
Nov 9 08:18:21 npis01 smartd[3097]: Device: /dev/sda [SAT], SMART Prefailure Attribute: 7 Seek_Error_Rate changed from 200 to 100
Nov 9 08:18:21 npis01 smartd[3097]: Device: /dev/sdb [SAT], SMART Prefailure Attribute: 7 Seek_Error_Rate changed from 200 to 100
"
Can anyone tell me what could cause this errors?
I already read that the failure-state should go back to 0 if everything is fine again, but i could not find any messange with this error going from 100 to 0 back again.

Thank you!
 
Seems ok to me, but i maybe should have a look on the link you postet.


The output of the command:
######################################################
smartctl -a /dev/sda

smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.15.39-1-pve] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Device Model: MB002000GWFWL
Serial Number: WCC6N0XNE2T3
LU WWN Device Id: 5 0014ee 269b85727
Firmware Version: HPG6
User Capacity: 2,000,398,934,016 bytes [2.00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: 7200 rpm
Form Factor: 3.5 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-3 T13/2161-D revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Nov 14 16:22:52 2022 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 214) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x2025) SCT Status supported.
SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0027 178 177 021 Pre-fail Always - 4100
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002f 100 200 051 Pre-fail Always - 0
9 Power_On_Hours 0x0032 098 098 000 Old_age Always - 2101
10 Spin_Retry_Count 0x0033 100 253 051 Pre-fail Always - 0
169 Unknown_Attribute 0x0021 100 100 098 Pre-fail Offline - 0
180 Unknown_HDD_Attribute 0x002f 200 200 100 Pre-fail Always - 0
194 Temperature_Celsius 0x0022 123 113 000 Old_age Always - 24
196 Reallocated_Event_Count 0x0033 200 200 140 Pre-fail Always - 0

SMART Error Log not supported

SMART Self-test Log not supported

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.