Hi,
ERROR: job failed with err -5 - Input/output error
please check your system logs/journal for more information and the physical disks, both where the VM disks reside and the one used for the backup storage with e.g. smartctl.
root@promox:~# smartctl --all /dev/sda
smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.8.4-2-pve] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke,
www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: NT-256 2280
Serial Number: 0023367A01131
LU WWN Device Id: 5 000000 000000003
Firmware Version: H190117D
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: Not in smartctl database 7.3/5319
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Oct 29 15:37:46 2024 +05
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 33) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 2) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SCT capabilities: (0x0031) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 1813
12 Power_Cycle_Count 0x0012 100 100 000 Old_age Always - 16
167 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 0
168 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 21
169 Unknown_Attribute 0x0013 096 096 010 Pre-fail Always - 3670030
171 Unknown_Attribute 0x0032 000 000 000 Old_age Always - 2
172 Unknown_Attribute 0x0032 000 000 000 Old_age Always - 0
173 Unknown_Attribute 0x0012 200 200 000 Old_age Always - 8595636277
175 Program_Fail_Count_Chip 0x0022 070 100 010 Old_age Always - 0
180 Unused_Rsvd_Blk_Cnt_Tot 0x0033 100 100 000 Pre-fail Always - 1644
187 Reported_Uncorrect 0x0032 100 000 000 Old_age Always - 21
192 Power-Off_Retract_Count 0x0012 100 100 000 Old_age Always - 16
194 Temperature_Celsius 0x0022 030 030 000 Old_age Always - 30 (Min/Max 10/50)
206 Unknown_SSD_Attribute 0x0032 200 200 000 Old_age Always - 2
207 Unknown_SSD_Attribute 0x0032 200 200 000 Old_age Always - 87
208 Unknown_SSD_Attribute 0x0032 200 200 000 Old_age Always - 53
209 Unknown_SSD_Attribute 0x0032 200 200 000 Old_age Always - 5
210 Unknown_Attribute 0x0032 200 200 000 Old_age Always - 46
211 Unknown_Attribute 0x0032 200 200 000 Old_age Always - 25
231 Unknown_SSD_Attribute 0x0023 097 097 005 Pre-fail Always - 3
233 Media_Wearout_Indicator 0x0032 100 100 000 Old_age Always - 28364591744
234 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 228351836
241 Total_LBAs_Written 0x0032 100 100 000 Old_age Always - 19696617340
242 Total_LBAs_Read 0x0032 100 100 000 Old_age Always - 842359733
245 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 occurred at disk power-on lifetime: 1798 hours (74 days + 22 hours)
When the command that caused the error occurred, the device was in an unknown state.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 80 00 92 0b ea Error: UNC 128 sectors at LBA = 0x0a0b9200 = 168530432
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 80 00 92 0b ea 80 17d+05:34:40.504 READ DMA
c8 00 08 00 3a b5 ed 80 17d+05:34:40.504 READ DMA
c8 00 20 00 82 72 ed 80 17d+05:34:40.504 READ DMA
c8 00 08 90 dc 41 ed 80 17d+05:34:40.504 READ DMA
c8 00 00 48 50 36 ed 80 17d+05:34:40.504 READ DMA
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
